APPLICATION OF REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION TO THIN-FILM GROWTH AND CHARACTERIZATION

被引：6

作者：

COHEN, PI

PUKITE, PR

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1987年 / 5卷 / 04期

关键词：

D O I：

10.1116/1.574910

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：2027 / 2028

页数：2

共 11 条

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