APPLICATION OF ELECTRON-SPECTROSCOPY TO SURFACE STUDIES

[71] AUGER ELECTRON SPECTROSCOPY OF FCC METAL SURFACES [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (05) : 2425 - &

[72] PALMBERG PW, 1972, ELECTRON SPECTROSCOP

[73] ELECTRONIC-STRUCTURE OF SOLID SURFACES - CORE LEVEL EXCITATION TECHNIQUES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (01): : 176 - 182

[74] STUDY OF INTENSITIES OF AUGER LINES EXCITED BY ELECTRON BOMBARDMENT AND AL K ALPHA X-RAY [J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (13) : 5831 - &

[75] ELECTRONIC-STRUCTURE OF AMORPHOUS SI FROM PHOTOEMISSION AND OPTICAL STUDIES [J]. PHYSICAL REVIEW B, 1972, 5 (08): : 3017 - &

[76] PONG W, 1973, J APPL PHYS, V44, P174, DOI 10.1063/1.1661855

[77] POOLE RT, 1973, J PHYS F, V3, P46

[78] HIGH-RESOLUTION MEASUREMENTS OF L3M2,3M4,5 AUGER TRANSITIONS IN NICKEL AND COPPER [J]. PHYSICAL REVIEW LETTERS, 1972, 29 (17) : 1153 - &

[79] AUGER SPECTRA AND LEED PATTERNS FROM NICKEL DEPOSITS ON CLEAVED SILICON [J]. SURFACE SCIENCE, 1971, 26 (02) : 683 - &

[80] AUGER SPECTRA AND LEED PATTERNS FROM VACUUM CLEAVED SILICON CRYSTALS WITH CALIBRATED DEPOSITS OF IRON [J]. SURFACE SCIENCE, 1971, 24 (02) : 451 - &

[71] AUGER ELECTRON SPECTROSCOPY OF FCC METAL SURFACES [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (05) : 2425 - &

[72] PALMBERG PW, 1972, ELECTRON SPECTROSCOP

[73] ELECTRONIC-STRUCTURE OF SOLID SURFACES - CORE LEVEL EXCITATION TECHNIQUES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (01): : 176 - 182

[74] STUDY OF INTENSITIES OF AUGER LINES EXCITED BY ELECTRON BOMBARDMENT AND AL K ALPHA X-RAY [J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (13) : 5831 - &

[75] ELECTRONIC-STRUCTURE OF AMORPHOUS SI FROM PHOTOEMISSION AND OPTICAL STUDIES [J]. PHYSICAL REVIEW B, 1972, 5 (08): : 3017 - &

[76] PONG W, 1973, J APPL PHYS, V44, P174, DOI 10.1063/1.1661855

[77] POOLE RT, 1973, J PHYS F, V3, P46

[78] HIGH-RESOLUTION MEASUREMENTS OF L3M2,3M4,5 AUGER TRANSITIONS IN NICKEL AND COPPER [J]. PHYSICAL REVIEW LETTERS, 1972, 29 (17) : 1153 - &

[79] AUGER SPECTRA AND LEED PATTERNS FROM NICKEL DEPOSITS ON CLEAVED SILICON [J]. SURFACE SCIENCE, 1971, 26 (02) : 683 - &

[80] AUGER SPECTRA AND LEED PATTERNS FROM VACUUM CLEAVED SILICON CRYSTALS WITH CALIBRATED DEPOSITS OF IRON [J]. SURFACE SCIENCE, 1971, 24 (02) : 451 - &