SECONDARY-ELECTRON IMAGING-SYSTEM FOR A NUCLEAR MICROPROBE

被引：32

作者：

YOUNGER, PA ^{[1
]}

COOKSON, JA ^{[1
]}

机构：

[1] AERE,DIV NUCL PHYS,HARWELL OX11 0RA,OXFORDSHIRE,ENGLAND

来源：

NUCLEAR INSTRUMENTS & METHODS | 1979年 / 158卷 / 01期

关键词：

D O I：

10.1016/S0029-554X(79)91870-6

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A secondary electron imaging system has been developed to provide an efficient means of identifying the position of the beam spot on specimens analysed with the Harwell nuclear microprobe facility. Conventional signal processing is used to improve the image quality, and in addition a dividing circuit is used to reduce the effects of time variation of the accelerator beam current intensity. Images have been obtained with proton beams of energies 1.5 MeV and 2.8 MeV on a variety of specimens and good contrast is possible using beam currents as low as 200 pA. © 1979 North-Holland Publishing Co.

引用

页码：193 / 198

页数：6

共 9 条

[1] ELECTRON EMISSION FROM METALS UNDER HIGH-ENERGY HYDROGEN ION BOMBARDMENT
AARSET, B
CLOUD, RW
TRUMP, JG
[J]. JOURNAL OF APPLIED PHYSICS, 1954, 25 (11) : 1365 - 1368
[2] BECK HP, 1975, Z NATURFORSCH A, V30, P981
[3] PROTON MICROBEAMS, THEIR PRODUCTION AND USE
COOKSON, JA
FERGUSON, AT
PILLING, FD
[J]. JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1972, 12 (01): : 39 - 52
[4] COOKSON JA, 1970, R6300 AERE REP
[5] WIDE-BAND DETECTOR FOR MICRO-MICROAMPERE LOW-ENERGY ELECTRON CURRENTS
EVERHART, TE
THORNLEY, RFM
[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1960, 37 (07): : 246 - 248
[6] A NEW METHOD OF FORMING SCINTILLATORS FOR ELECTRON COLLECTORS
HATZAKIS, M
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (01) : 128 - &
[7] NEWBURY DE, 1975, 8TH P SEM S, P797
[8] THEORY OF SECONDARY ELECTRON EMISSION BY HIGH-SPEED IONS
STERNGLASS, EJ
[J]. PHYSICAL REVIEW, 1957, 108 (01): : 1 - 12
[9] COLLECTOR TURRET FOR SCANNING ELECTRON MICROSCOPE
WELLS, OC
BREMER, CG
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (07) : 1034 - &

← 1 →