COLLECTOR TURRET FOR SCANNING ELECTRON MICROSCOPE

被引：7

作者：

WELLS, OC

BREMER, CG

机构：

来源：

关键词：

D O I：

10.1063/1.1684691

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1034 / &

共 10 条

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[2] IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPE
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[3] DAVEY JP, 1965, 6 P INT C X RAYS MIC, P566
[4] Evekhart T.E., 1959, J ELECT CONTROL, V7, P97, DOI 10.1080/00207215908937191
[5] WIDE-BAND DETECTOR FOR MICRO-MICROAMPERE LOW-ENERGY ELECTRON CURRENTS
EVERHART, TE
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[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1960, 37 (07): : 246 - 248
[6] KIMOTO S, 1966, 6 P INT C EL MICR KY, P197
[7] SMITH KCA, 1956, THESIS CAMBRIDGE U
[8] SCANNING TRANSMISSION ELECTRON MICROSCOPY WITH CAMBRIDGE STEREOSCAN MK-2
SWIFT, JA
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[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (08): : 744 - &
[9] IMPROVED ENERGY ANALYSER FOR SCANNING ELECTRON MICROSCOPE
WELLS, OC
BREMER, CG
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (12): : 1120 - &
[10] NEW CONTRAST MECHANISM FOR SCANNING ELECTRON MICROSCOPE
WELLS, OC
[J]. APPLIED PHYSICS LETTERS, 1970, 16 (04) : 151 - &