DETERMINATION OF CRYSTAL SYMMETRY FROM ELECTRON CHANNELING PATTERNS

被引：9

作者：

MARTHINSEN, K ^{[1
]}

HOIER, R ^{[1
]}

机构：

[1] UNIV TRONDHEIM,DEPT PHYS & MATH,N-7034 TRONDHEIM,NORWAY

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1988年 / 44卷

关键词：

D O I：

10.1107/S0108767388003538

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：693 / 700

页数：8

共 20 条

[1] SYMMETRY OF ELECTRON-DIFFRACTION ZONE AXIS PATTERNS [J].

BUXTON, BF ;

EADES, JA ;

STEEDS, JW ;

RACKHAM, GM .

PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1976, 281 (1301) :171-+

[2]

DINGLEY DS, 1986, SCANNING ELECTRON MI, V11, P383

[3] EXTINCTION CONDITIONS IN DYNAMIC THEORY OF ELECTRON DIFFRACTION [J].

GJONNES, J ;

MOODIE, AF .

ACTA CRYSTALLOGRAPHICA, 1965, 19 :65-&

[4] PRACTICAL METHOD OF 3-DIMENSIONAL SPACE-GROUP ANALYSIS USING CONVERGENT-BEAM ELECTRON-DIFFRACTION [J].

GOODMAN, P .

ACTA CRYSTALLOGRAPHICA SECTION A, 1975, 31 (NOV1) :804-&

[5] A METHOD TO DETERMINE RATIO BETWEEN LATTICE PARAMETER AND ELECTRON WAVELENGTH FROM KIKUCHI LINE INTERSECTIONS [J].

HOIER, R .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1969, A 25 :516-&

[6]

HOIER R, 1986, 11TH P INT C EL MICR, P757

[7]

Joy D.C., 1974, QUANTITATIVE SCANNIN, P131

[8] ELECTRON CHANNELING PATTERNS IN THE SCANNING ELECTRON-MICROSCOPE [J].

JOY, DC ;

NEWBURY, DE ;

DAVIDSON, DL .

JOURNAL OF APPLIED PHYSICS, 1982, 53 (08) :R81-R122

[9] DETERMINATION OF STRUCTURE-FACTOR PHASE INVARIANTS AND EFFECTIVE STRUCTURE FACTORS IN NON-CENTROSYMMETRIC CRYSTALS [J].

MARTHINSEN, K ;

HOIER, R .

ACTA CRYSTALLOGRAPHICA SECTION A, 1988, 44 :558-562

[10] ON THE BREAKDOWN OF FRIEDEL LAW IN ELECTRON BACKSCATTERING CHANNELING PATTERNS [J].

MARTHINSEN, K ;

HOIER, R .

ACTA CRYSTALLOGRAPHICA SECTION A, 1988, 44 :700-707

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