CORRELATION OF LOCAL TRAPPING WITH CRYSTAL DEFECTS BY DIRECT OBSERVATION OF ELECTRON LOSS IN A COAXIAL GE(LI) DETECTOR

被引：7

作者：

STRAUSS, MG ^{[1
]}

SHERMAN, IS ^{[1
]}

BANNON, RW ^{[1
]}

机构：

[1] ARGONNE NATL LAB,ARGONNE,IL 60439

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1974年 / NS21卷 / 01期

关键词：

D O I：

10.1109/TNS.1974.4327474

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：296 / 301

页数：6

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[9] APPLICATION OF A PULSE SHAPE SELECTION METHOD TO A TRUE COAXIAL GE(LI) DETECTOR FOR MEASUREMENTS OF NANOSECONDS HALF-LIVES [J].

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