ULTRAFAST DIFFUSION OF A DEFECT IN INDIUM-DOPED SILICON INTRODUCED BY CHEMOMECHANICAL POLISHING

被引:36
作者
ZUNDEL, T [1 ]
WEBER, J [1 ]
BENSON, B [1 ]
HAHN, PO [1 ]
SCHNEGG, A [1 ]
PRIGGE, H [1 ]
机构
[1] WACKER CHEMITRON GMBH,RES CTR,D-8263 BURGHAUSEN,FED REP GER
关键词
D O I
10.1063/1.99962
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:1426 / 1428
页数:3
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