AN INTERFEROMETRIC METHOD FOR THE CALIBRATION OF ELECTRON MICROSCOPE MAGNIFICATION

被引：11

作者：

FARRANT, JL

HODGE, AJ

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1948年 / 19卷 / 09期

关键词：

D O I：

10.1063/1.1698217

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：840 / 844

页数：5

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