THE METHOD OF INTEGRAL CHARACTERISTICS IN X-RAY-DIFFRACTION STUDIES OF THE STRUCTURE OF THE SURFACE-LAYERS OF SINGLE-CRYSTALS

被引：24

作者：

KOHN, VG ^{[1
]}

KOVALCHUK, MV ^{[1
]}

IMAMOV, RM ^{[1
]}

LOBANOVICH, EF ^{[1
]}

机构：

[1] AV SHUBNIKOV CRYSTALLOG INST,MOSCOW,USSR

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1981年 / 64卷 / 02期

关键词：

D O I：

10.1002/pssa.2210640203

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：435 / 442

页数：8

共 16 条

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[7] APPLICATION OF DYNAMIC THEORY OF X DIFFRACTION IN STUDY OF BORON DIFFUSION AND OF PHOSPHORUS DIFFUSION IN SILICON CRYSTALS [J].

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[8]

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[10]

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