EFFECTS OF HUMIDITY AND TIP RADIUS ON THE ADHESIVE FORCE MEASURED WITH ATOMIC-FORCE MICROSCOPY

被引：35

作者：

SUGAWARA, Y

OHTA, M

KONISHI, T

MORITA, S

SUZUKI, M

ENOMOTO, Y

机构：

[1] NIPPON TELEGRAPH & TEL PUBL CORP, INTERDISCIPLINARY RES LABS, MUSASHINO, TOKYO 180, JAPAN

[2] MECH ENGN LAB, TSUKUBA, IBARAKI 305, JAPAN

来源：

WEAR | 1993年 / 168卷 / 1-2期

关键词：

D O I：

10.1016/0043-1648(93)90191-N

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

We have developed an ultrahigh vacuum (UHV) atomic force microscope with fibre-optic interferometer. The cleaved (100) surface of the LiF crystal was imaged with atomic resolution in UHV. Force vs. distance measurements were taken in air and in UHV, and the influence of the humidity and of the tip radius of several hundred Angstroms on the adhesive force was studied. We observed a tendency for the adhesive force to increase with increase in humidity. We also observed that the adhesive force at constant humidity increased monotonically with increase in the radius of curvature. These adhesive forces were four orders of magnitude smaller than those for a glass sphere of radius several millimetres.

引用

页码：13 / 16

页数：4

共 16 条

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