MEASURING THE NANOMECHANICAL PROPERTIES AND SURFACE FORCES OF MATERIALS USING AN ATOMIC FORCE MICROSCOPE

被引：511

作者：

BURNHAM, NA

COLTON, RJ

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1989年 / 7卷 / 04期

关键词：

D O I：

10.1116/1.576168

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：2906 / 2913

页数：8

共 32 条

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[2] IMAGING AND MODIFICATION OF POLYMERS BY SCANNING TUNNELING AND ATOMIC FORCE MICROSCOPY
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[8] A method for interpreting the data from depth-sensing indentation instruments
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[9] EXPERIMENTAL-OBSERVATION OF FORCES ACTING DURING SCANNING TUNNELING MICROSCOPY
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[J]. PHYSICAL REVIEW LETTERS, 1986, 57 (19) : 2403 - 2406
[10] ATOMIC SCALE FRICTION BETWEEN THE MUSCOVITE MICA CLEAVAGE PLANE AND A TUNGSTEN TIP
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CHIANG, S
[J]. JOURNAL OF CHEMICAL PHYSICS, 1988, 89 (08) : 5190 - 5193

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