IMAGING AND MODIFICATION OF POLYMERS BY SCANNING TUNNELING AND ATOMIC FORCE MICROSCOPY

被引：142

作者：

ALBRECHT, TR

DOVEK, MM

LANG, CA

GRUTTER, P

QUATE, CF

KUAN, SWJ

FRANK, CW

PEASE, RFW

机构：

[1] STANFORD UNIV,DEPT CHEM ENGN,STANFORD,CA 94305

[2] STANFORD UNIV,DEPT ELECT ENGN,STANFORD,CA 94305

[3] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304

来源：

关键词：

D O I：

10.1063/1.341881

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1178 / 1184

页数：7

共 35 条

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[2] ATOMIC RESOLUTION WITH THE ATOMIC FORCE MICROSCOPE ON CONDUCTORS AND NONCONDUCTORS
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[4] ENERGY-DEPENDENT STATE-DENSITY CORRUGATION OF A GRAPHITE SURFACE AS SEEN BY SCANNING TUNNELING MICROSCOPY
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[6] SINGLE-TUBE 3-DIMENSIONAL SCANNER FOR SCANNING TUNNELING MICROSCOPY
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[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (08) : 1688 - 1689
[7] BINNIG G, 1986, B AM PHYS SOC, V31, P217
[8] IMAGING IN REAL-TIME WITH THE TUNNELING MICROSCOPE
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SMITH, DPE
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[9] POLYMERIZATION OF VINYL STEARATE MULTILAYERS
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