ANALYTIC EVALUATION OF DIFFUSED IMPURITY LAYERS IN SILICON

被引：3

作者：

GUPTA, ML

BHATTACHARYYA, AB

机构：

来源：

关键词：

D O I：

10.1049/el:19700205

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：291 / +

页数：1

共 8 条

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[6] DRIFT MOBILITIES IN SEMICONDUCTORS .2. SILICON [J].

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WOLF HF, 1969, SILICON SEMICONDUCTO, pCH2