A SENSITIVE SPECTROPHOTOMETER FOR OPTICAL REFLECTANCE AND TRANSMITTANCE MEASUREMENTS

被引：49

作者：

SELL, DD

机构：

来源：

APPLIED OPTICS | 1970年 / 9卷 / 08期

关键词：

D O I：

10.1364/AO.9.001926

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

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页码：1926 / &

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[J]. APPLIED OPTICS, 1968, 7 (11): : 2218 - &
[2] A NORMAL INCIDENCE SCANNING REFLECTOMETER OF HIGH PRECISION
GERHARDT, U
RUBLOFF, GW
[J]. APPLIED OPTICS, 1969, 8 (02): : 305 - &
[3] A DOUBLE BEAM SPECTROPHOTOMETER FOR DIRECT MEASUREMENT OF INTEGRATED ABSORPTION LINES
NICOL, DR
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (10) : 1300 - &
[4] RICE SO, UNPUBLISHED NOTES
[5] RICE SO, PERSONAL COMMUNICATI
[6] WAVELENGTH MODULATION SPECTROMETER FOR STUDYING OPTICAL PROPERTIES OF SOLIDS
SHAKLEE, KL
ROWE, JE
[J]. APPLIED OPTICS, 1970, 9 (03): : 627 - &