A SENSITIVE SINGLE BEAM DEVICE FOR CONTINUOUS REFLECTANCE OR TRANSMITTANCE MEASUREMENTS

被引：49

作者：

BEAGLEHO.D

机构：

[1] The University of Maryland, College Park, MD

来源：

APPLIED OPTICS | 1968年 / 7卷 / 11期

关键词：

D O I：

10.1364/AO.7.002218

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We describe a single beam device that records continuously as a function of wavelength, simple quantities related to the reflectance and transmittance, (1 - R)/(1 + R) and (1-T)/(1+T). The unit is easily attached to any spectrometer. It is sensitive to changes in these quantities of about 1 X 10-4, while systematic errors in alignment set an absolute accuracy of about 1 X 10-3. © 1968 Optical Society of America.

引用

页码：2218 / &