A NEW MEASUREMENT OF VELOCITY-FIELD CHARACTERISTIC OF GAAS

被引:15
作者
FAY, B
KINO, GS
机构
[1] Microwave Laboratory, W. W. Hansen Laboratories of Physics, Stanford University, Stanford
关键词
D O I
10.1063/1.1652849
中图分类号
O59 [应用物理学];
学科分类号
摘要
The velocity-field characteristic for electrons in GaAs has been measured in the negative differential mobility region between 4.5 and 11 kV/cm by a new direct method involving probe measurements on the surface of a bulk GaAs two-port amplifier. The measurements were taken on GaAs of resistivity in the 500-1000 Ω-cm range. © 1969 The American Institute of Physics.
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页码:337 / +
页数:1
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