CHARACTERIZATION OF SILICON DIOXIDE FILMS BY ELECTRON PROBE

被引：12

作者：

SWAROOP, B

机构：

来源：

关键词：

D O I：

10.1149/1.2408223

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：913 / &

共 19 条

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[6]

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GREEN, M ;

COSSLETT, VE .

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[8]

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[9]

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[10]

HUTCHINS GA, 1966, ELECTRON MICROPROBE, P390