EFFECT OF THIN-FILM HEAT-TRANSFER ON MENISCUS PROFILE AND CAPILLARY-PRESSURE

被引：17

作者：

WAYNER, PC

机构：

[1] Rensselaer Polytechnic Institute, Chemical Engineering, Dept. Of Chemical and Environmental Engineering, Troy, NY

来源：

AIAA JOURNAL | 1979年 / 17卷 / 07期

基金：

美国国家科学基金会;

关键词：

D O I：

10.2514/3.61217

中图分类号：

V [航空、航天];

学科分类号：

08 ; 0825 ;

摘要：

Viscous flow in a thin film in the immediate vicinity of the interline (junction of solid-liquid-vapor) significantly affects the complete profile of an evaporating meniscus. An analysis based on the premise that fluid flow results from the London-van der Waals dispersion force is used to evaluate this change as a function of heat flux. The useful capillary pressure of the meniscus is significantly reduced as the interline heat flux is increased. The dispersion model predicts measurable changes in the meniscus heat-transfer characteristics which are related to the macroscopic optical properties of the solid and liquid. © 1979 American Institute of Aeronautics and Astronautics, Inc., All rights reserved.

引用

页码：772 / 776

页数：5