INTRINSIC RESPONSE-TIME OF NORMALLY OFF MESFETS OF GAAS, SI, AND INP

被引:5
作者
INO, M
OHMORI, M
机构
关键词
D O I
10.1109/TMTT.1980.1130100
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:456 / 459
页数:4
相关论文
共 8 条
  • [1] COMPARISON OF HOT ELECTRON DIFFUSION RATES FOR GAAS AND INP
    BAUHAHN, PE
    HADDAD, GI
    MASNARI, NA
    [J]. ELECTRONICS LETTERS, 1973, 9 (19) : 460 - 461
  • [2] MOBILITY, TRANSIT-TIME AND TRANSCONDUCTANCE IN SUBMICROMETER-GATE-LENGTH MESFETS
    FREY, J
    WADA, T
    [J]. ELECTRONICS LETTERS, 1979, 15 (01) : 26 - 27
  • [3] GREILING PT, 1978, JUN DEV RES C
  • [4] REVIEW OF SOME CHARGE TRANSPORT PROPERTIES OF SILICON
    JACOBONI, C
    CANALI, C
    OTTAVIANI, G
    QUARANTA, AA
    [J]. SOLID-STATE ELECTRONICS, 1977, 20 (02) : 77 - 89
  • [5] VELOCITY-FIELD CHARACTERISTICS OF GA1-XINXP1-YASY QUATERNARY ALLOYS
    LITTLEJOHN, MA
    HAUSER, JR
    GLISSON, TH
    [J]. APPLIED PHYSICS LETTERS, 1977, 30 (05) : 242 - 244
  • [6] LUNDGREN RE, 1979, JUN DEV RES C
  • [7] MIZUTANI T, 1979, 1ST SPEC C GIG LOG M
  • [8] 2-DIMENSIONAL NUMERICAL FET MODEL FOR DC, AC, AND LARGE-SIGNAL ANALYSIS
    REISER, M
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1973, ED20 (01) : 35 - 45