EXAFS STUDIES ON SUPERFICIAL REGIONS BY MEANS OF TOTAL REFLECTION

[1] X-RAY PHOTOABSORPTION OF SOLIDS BY SPECULAR REFLECTION [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1978, 11 (21): : 4439 - 4445

[2] EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE OF SURFACE ATOMS ON SINGLE-CRYSTAL SUBSTRATES - IODINE ADSORBED ON AG(111) [J]. PHYSICAL REVIEW LETTERS, 1978, 41 (05) : 309 - 312

[3] DELCUETO JA, 1978, J PHYS C SOLID STATE, V11, pL833, DOI 10.1088/0022-3719/11/20/003

[4] FREUND A, 1975, ANOMALOUS SCATTERING

[5] MEASUREMENTS OF X-RAY ANOMALOUS SCATTERING FACTORS NEAR THE CU K ABSORPTION-EDGE BY THE USE OF SYNCHROTRON RADIATION [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 : 326 - 328

[6] EXTENDED-X-RAY-ABSORPTION-FINE-STRUCTURE STUDY OF BR2-GRAPHITE SYSTEM [J]. PHYSICAL REVIEW B, 1978, 17 (10): : 4069 - 4081

[7] APPLICATION OF THE DISPERSION-RELATION TO DETERMINE THE ANOMALOUS SCATTERING FACTORS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 : 224 - 226

[8] NEW APPLICATION OF EXTENDED X-RAY ABSORPTION FINE-STRUCTURE (EXAFS) AS A SURFACE PROBE-NATURE OF OXYGEN INTERACTION WITH A RUTHENIUM CATALYST [J]. JOURNAL OF CHEMICAL PHYSICS, 1977, 67 (08) : 3831 - 3832

[9] EXAFS IN PHOTOELECTRON YIELD SPECTRA AT K EDGES OF CU, NI, AND GE [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1979, 55 (01): : 105 - 108

[10] IMPROVED EXTENDED-X-RAY-ABSORPTION FINE-STRUCTURE (EXAFS) STUDIES APPLIED TO INVESTIGATION OF CU-O, CU-N, AND CU-BR BOND LENGTHS [J]. PHYSICAL REVIEW B, 1978, 17 (04): : 1481 - 1488

[1] X-RAY PHOTOABSORPTION OF SOLIDS BY SPECULAR REFLECTION [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1978, 11 (21): : 4439 - 4445

[2] EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE OF SURFACE ATOMS ON SINGLE-CRYSTAL SUBSTRATES - IODINE ADSORBED ON AG(111) [J]. PHYSICAL REVIEW LETTERS, 1978, 41 (05) : 309 - 312

[3] DELCUETO JA, 1978, J PHYS C SOLID STATE, V11, pL833, DOI 10.1088/0022-3719/11/20/003

[4] FREUND A, 1975, ANOMALOUS SCATTERING

[5] MEASUREMENTS OF X-RAY ANOMALOUS SCATTERING FACTORS NEAR THE CU K ABSORPTION-EDGE BY THE USE OF SYNCHROTRON RADIATION [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 : 326 - 328

[6] EXTENDED-X-RAY-ABSORPTION-FINE-STRUCTURE STUDY OF BR2-GRAPHITE SYSTEM [J]. PHYSICAL REVIEW B, 1978, 17 (10): : 4069 - 4081

[7] APPLICATION OF THE DISPERSION-RELATION TO DETERMINE THE ANOMALOUS SCATTERING FACTORS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 : 224 - 226

[8] NEW APPLICATION OF EXTENDED X-RAY ABSORPTION FINE-STRUCTURE (EXAFS) AS A SURFACE PROBE-NATURE OF OXYGEN INTERACTION WITH A RUTHENIUM CATALYST [J]. JOURNAL OF CHEMICAL PHYSICS, 1977, 67 (08) : 3831 - 3832

[9] EXAFS IN PHOTOELECTRON YIELD SPECTRA AT K EDGES OF CU, NI, AND GE [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1979, 55 (01): : 105 - 108

[10] IMPROVED EXTENDED-X-RAY-ABSORPTION FINE-STRUCTURE (EXAFS) STUDIES APPLIED TO INVESTIGATION OF CU-O, CU-N, AND CU-BR BOND LENGTHS [J]. PHYSICAL REVIEW B, 1978, 17 (04): : 1481 - 1488