THE TENSOR OF COMPOSITIONAL DEFORMATION - A NEW CRYSTALLOGRAPHIC WAY TO ANALYZE SYNCRYSTALLIZATION

被引：18

作者：

CHANH, NB

CLASTRE, J

GAULTIER, J

HAGET, Y

MERESSE, A

LAJZEROWICZ, J

FILHOL, A

THOMAS, M

机构：

[1] UNIV GRENOBLE,SPECTROMETRIE PHYS LAB,F-38402 ST MARTIN DHERES,FRANCE

[2] INST LAUE LANGEVIN,F-38042 GRENOBLE,FRANCE

来源：

关键词：

D O I：

10.1107/S0021889887008185

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：10 / 14

页数：5

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Nye J. F., 1961, PROPRIETES PHYSIQUES

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BEGUEMSI, T ;

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