THE EXXON MICROTOMOGRAPHY BEAM LINE AT THE NATIONAL SYNCHROTRON LIGHT-SOURCE

被引：11

作者：

DAMICO, KL

DUNSMUIR, JH

FERGUSON, SR

FLANNERY, BP

DECKMAN, HW

机构：

[1] Corporate Research Laboratory, Exxon Research and Engineering Company, Annandale, NJ 08801

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1992年 / 63卷 / 01期

关键词：

D O I：

10.1063/1.1142709

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Instrumentation for beam line X2 at the National Synchrotron Light Source is described. The beam line is configured as a dedicated experimental station whose design has been optimized for carrying out both microtomography and microradiography. The facility has proven to be a reliable three-dimensional microscope for imaging the interior structure of heterogeneous materials.

引用

页码：574 / 577

页数：4

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