ELECTROOPTIC MODE-DISPLACEMENT SILICON LIGHT-MODULATOR

被引:16
作者
PIRNAT, T [1 ]
FRIEDMAN, L [1 ]
SOREF, RA [1 ]
机构
[1] USAF,ROME LAB,ELECTROMAGNET & RELIABIL DIRECTORATE,BEDFORD,MA 01731
关键词
D O I
10.1063/1.349271
中图分类号
O59 [应用物理学];
学科分类号
摘要
A new type of guided-wave electro-optical intensity modulator is proposed and analyzed. The waveguide consists of an N-type Si core layer on a P-type Si substrate. Foward bias on the N+-N-P-P+ diode decreases the refractive index of the core and displaces the fundamental guided mode downward into the substrate. However, the mode is not extinguished because the substrate is bounded by a P+ contact. A spatial filter at the output converts the mode displacement into optical intensity modulation. A Poisson and continuity equation solver and multilayer waveguide simulation were used to obtain numerical estimates of mode displacement in a realistic structure.
引用
收藏
页码:3355 / 3359
页数:5
相关论文
共 3 条
[1]  
GIGUERE S, 1990, J APPL PHYS, V68, P4970
[2]   WAVEGUIDED ELECTROOPTICAL INTENSITY MODULATION IN A SI/GEXSI1-X/SI HETEROJUNCTION BIPOLAR-TRANSISTOR [J].
LAREAU, RD ;
FRIEDMAN, L ;
SOREF, RA .
ELECTRONICS LETTERS, 1990, 26 (20) :1653-1655
[3]   SILICON ANTIRESONANT REFLECTING OPTICAL WAVE-GUIDES [J].
SOREF, RA ;
RITTER, KJ .
OPTICS LETTERS, 1990, 15 (14) :792-794