OBSERVATIONS OF INSTABILITY IN SEMICONDUCTORS CAUSED BY HEAVILY INJECTED MINORITY CARRIERS

被引：22

作者：

KIKUCHI, M

ABE, Y

机构：

来源：

关键词：

D O I：

10.1143/JPSJ.17.1268

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1268 / &

共 17 条

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