ADVANTAGES OF SYNCHROTRON RADIATION FOR POLYCRYSTALLINE DIFFRACTOMETRY

被引：24

作者：

PARRISH, W ^{[1
]}

HART, M ^{[1
]}

机构：

[1] UNIV MANCHESTER,DEPT PHYS,MANCHESTER M13 9PL,LANCS,ENGLAND

来源：

ZEITSCHRIFT FUR KRISTALLOGRAPHIE | 1987年 / 179卷 / 1-4期

关键词：

D O I：

10.1524/zkri.1987.179.1-4.161

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：161 / 173

页数：13

共 16 条

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[3] Hart M., 1986, Materials Science Forum, V9, P39, DOI 10.4028/www.scientific.net/MSF.9.39
[4] SYNCHROTRON X-RAY-POWDER DIFFRACTION
HASTINGS, JB
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[5] LINE-BROADENING ANALYSIS OF SYNCHROTRON X-RAY-DIFFRACTION DATA
HUANG, TC
HART, M
PARRISH, W
MASCIOCCHI, N
[J]. JOURNAL OF APPLIED PHYSICS, 1987, 61 (08) : 2813 - 2816
[6] Lim G., 1987, Journal of Materials Research, V2, P471, DOI 10.1557/JMR.1987.0471
[7] SYNCHROTRON X-RAY POLYCRYSTALLINE DIFFRACTOMETRY
PARRISH, W
HART, M
HUANG, TC
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1986, 19 : 92 - 100
[8] PARRISH W, 1987, IN PRESS ADV XRAY AN, V30
[9] PARRISH W, 1965, XRAY ANAL PAPERS
[10] PARRISH W, 1980, NBS SPEC PUB, V457, P95