ELECTRONIC PROCESSING OF MOIRE FRINGES - APPLICATION TO MOIRE TOPOGRAPHY AND COMPARISON WITH PHOTOGRAMMETRY

被引：32

作者：

PERRIN, JC ^{[1
]}

THOMAS, A ^{[1
]}

机构：

[1] CO ELECTRO MECAN,CTR ETUD & RECH,F-93350 LE BOURGET,FRANCE

来源：

APPLIED OPTICS | 1979年 / 18卷 / 04期

关键词：

D O I：

10.1364/AO.18.000563

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Some elements of comparison are given between projection-type moiré topography and photogrammetry. The basic mathematics of photogrammetry is used to reconstruct the 3-D shape of the object from the moiré pattern. Some particular aspects of the moiré method are discussed, and a general methodology is proposed. In connection with this, an optoelectronic technique is described, which measures the moiré phase with high resolution and sign determination. The experimental results show that this technique is especially suitable for high accuracy automatic reconstruction of 3-D shapes. © 1979 Optical Society of America.

引用

页码：563 / 574

页数：12