FIELD CORROSION OF FIELD-ION MICROSCOPE SPECIMENS CAUSED BY POLYMER GASKETS

被引：2

作者：

ANDREN, HO

HENJERED, A

NORDEN, H

机构：

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1980年 / 13卷 / 04期

关键词：

D O I：

10.1088/0022-3735/13/4/009

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：392 / 395

页数：4

共 13 条

[1]

ANDREN HO, 1979, SCAND J METALL, V8, P147

[2] SPECIMEN TRANSFER DEVICE FOR AN ULTRA-HIGH VACUUM FIELD ION MICROSCOPE [J].

BARGERY, CJ ;

ADAM, J ;

RIVIERE, JC .

JOURNAL OF SCIENTIFIC INSTRUMENTS, 1967, 44 (09) :692-&

[3]

Beaven P. A., 1977, Developments in Electron Microscopy and Analysis 1977, P199

[4]

Boyes E. D., 1977, Developments in Electron Microscopy and Analysis 1977, P343

[5] SIMPLE SPECIMEN AIRLOCK FOR FIELD-ION MICROSCOPES [J].

GILLOTT, L .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (02) :121-122

[6]

GOODMAN SR, 1973, METALL TRANS, V4, P2363, DOI 10.1007/BF02669376

[7]

Kornfel'd M. I., 1976, Soviet Physics - Solid State, V17, P596

[8] INELASTIC CHANGES IN SPECIMENS DURING OPERATION OF FIELD-ION MICROSCOPE [J].

LOBERG, B .

PHILOSOPHICAL MAGAZINE, 1971, 24 (189) :593-&

[9] HELIUM GAS-FLOW CRYOSTAT AND SPECIMEN AIRLOCK ASSEMBLY FOR ULTRAHIGH-VACUUM USE [J].

MILLER, MK ;

GODFREY, TJ ;

SMITH, GDW .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (02) :116-118

[10]

Turner P. J., 1973, Metal Science Journal, V7, P81

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