THE ART AND SCIENCE AND OTHER ASPECTS OF MAKING SHARP TIPS

被引:241
作者
MELMED, AJ
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1991年 / 9卷 / 02期
关键词
D O I
10.1116/1.585467
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A partial review of the development of schemes for making sharp points for use in various microscopies is presented. The major and some minor techniques are discussed with emphasis on electropolishing methods.
引用
收藏
页码:601 / 608
页数:8
相关论文
共 31 条
[1]   NEW SCANNING TUNNELING MICROSCOPY TIP FOR MEASURING SURFACE-TOPOGRAPHY [J].
AKAMA, Y ;
NISHIMURA, E ;
SAKAI, A ;
MURAKAMI, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (01) :429-433
[2]   SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].
BINNING, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61
[3]   TECHNIQUE FOR SHAPING SCANNING TUNNELING MICROSCOPE TIPS [J].
BRYANT, PJ ;
KIM, HS ;
ZHENG, YC ;
YANG, R .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1987, 58 (06) :1115-1115
[4]   A COMBINED TEM FIM EXAMINATION OF FIELD-EMISSION AS A FIM SPECIMEN PREPARATION TECHNIQUE [J].
BURKE, MG ;
SIELOFF, DD ;
BRENNER, SS .
JOURNAL DE PHYSIQUE, 1986, 47 (C-7) :459-462
[5]  
DOUDS CF, 1957, THESIS PENNSYLVANIA
[6]  
Dyke W P, 1956, ADV ELECT ELECTRON P, V8, P89
[7]   PREPARATION OF CONTAMINATION-FREE TUNGSTEN SPECIMENS FOR FIELD-ION MICROSCOPE [J].
FASTH, JE ;
LOBERG, B ;
NORDEN, H .
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1967, 44 (12) :1044-&
[8]  
GOMER R, 1958, J CHEM PHYS, V28, P458
[9]  
Good RH., 1956, FIELD EMISSION, P176
[10]  
HIBI T, 1956, J ELECTRON MICROSC, V4, P10