ELLIPSOMETRY OF TRANSPARENT FILMS ON TRANSPARENT SUBSTRATES

被引：6

作者：

AZZAM, RMA

机构：

来源：

SURFACE SCIENCE | 1980年 / 96卷 / 1-3期

关键词：

D O I：

10.1016/0039-6028(80)90295-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：67 / 80

页数：14

共 12 条

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[2] COMBINED REFLECTION AND TRANSMISSION THIN-FILM ELLIPSOMETRY - UNIFIED LINEAR ANALYSIS [J].

AZZAM, RMA ;

ELSHAZLYZAGHLOUL, M ;

BASHARA, NM .

APPLIED OPTICS, 1975, 14 (07) :1652-1663

[3] POLAR CURVES FOR TRANSMISSION ELLIPSOMETRY [J].

AZZAM, RMA .

OPTICS COMMUNICATIONS, 1975, 14 (01) :145-147

[4] POLARIZATION-INDEPENDENT REFLECTANCE MATCHING (PIRM) A TECHNIQUE FOR DETERMINATION OF REFRACTIVE-INDEX AND THICKNESS OF TRANSPARENT FILMS [J].

AZZAM, RMA ;

ZAGHLOUL, ARM .

JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE, 1977, 8 (03) :201-205

[5] ELLIPSOMETRIC FUNCTION OF A FILM-SUBSTRATE SYSTEM - APPLICATIONS TO DESIGN OF REFLECTION-TYPE OPTICAL DEVICES AND TO ELLIPSOMETRY [J].

AZZAM, RMA ;

ZAGHLOUL, ARM ;

BASHARA, NM .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1975, 65 (03) :252-260

[6]

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[7]

Azzam RMA, 1977, ELLIPSOMETRY POLARIZ

[8]

Heavens O. S., 1965, OPTICAL PROPERTIES T, P209

[9] DETERMINATION OF OPTICAL-CONSTANTS - MATCHING METHODS [J].

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[10]

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