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COMBINED REFLECTION AND TRANSMISSION THIN-FILM ELLIPSOMETRY - UNIFIED LINEAR ANALYSIS
被引:34
作者
:
AZZAM, RMA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV NEBRASKA,COLL ENGN,ELECT MAT LAB,LINCOLN,NB 68508
UNIV NEBRASKA,COLL ENGN,ELECT MAT LAB,LINCOLN,NB 68508
AZZAM, RMA
[
1
]
ELSHAZLYZAGHLOUL, M
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV NEBRASKA,COLL ENGN,ELECT MAT LAB,LINCOLN,NB 68508
UNIV NEBRASKA,COLL ENGN,ELECT MAT LAB,LINCOLN,NB 68508
ELSHAZLYZAGHLOUL, M
[
1
]
BASHARA, NM
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV NEBRASKA,COLL ENGN,ELECT MAT LAB,LINCOLN,NB 68508
UNIV NEBRASKA,COLL ENGN,ELECT MAT LAB,LINCOLN,NB 68508
BASHARA, NM
[
1
]
机构
:
[1]
UNIV NEBRASKA,COLL ENGN,ELECT MAT LAB,LINCOLN,NB 68508
来源
:
APPLIED OPTICS
|
1975年
/ 14卷
/ 07期
关键词
:
D O I
:
10.1364/AO.14.001652
中图分类号
:
O43 [光学];
学科分类号
:
070207 ;
0803 ;
摘要
:
引用
收藏
页码:1652 / 1663
页数:12
相关论文
共 25 条
[1]
OPTICAL MEASUREMENT OF FILM GROWTH ON SILICON AND GERMANIUM SURFACES IN ROOM AIR
ARCHER, RJ
论文数:
0
引用数:
0
h-index:
0
ARCHER, RJ
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1957,
104
(10)
: 619
-
622
[2]
Aspnes D. E., 1973, Optics Communications, V8, P222, DOI 10.1016/0030-4018(73)90132-6
[3]
SPECIMEN COHERENT SCATTERING AND COMPENSATOR DEFECTS IN ELLIPSOMETRY
AZZAM, RMA
论文数:
0
引用数:
0
h-index:
0
AZZAM, RMA
BASHARA, NM
论文数:
0
引用数:
0
h-index:
0
BASHARA, NM
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1971,
61
(09)
: 1236
-
&
[4]
BASHARA NM, 1969, P S RECENT DEVELOPME
[5]
ELLIPSOMETRY IN SUB-MONOLAYER REGION
BOOTSMA, GA
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, N.V. Philips' Gloeilampenfabrieken, Eindhoven
BOOTSMA, GA
MEYER, F
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, N.V. Philips' Gloeilampenfabrieken, Eindhoven
MEYER, F
[J].
SURFACE SCIENCE,
1969,
14
(01)
: 52
-
&
[6]
EFFECT OF THIN SURFACE FILM ON ELLIPSOMETRIC DETERMINATION OF OPTICAL CONSTANTS
BURGE, DK
论文数:
0
引用数:
0
h-index:
0
BURGE, DK
BENNETT, HE
论文数:
0
引用数:
0
h-index:
0
BENNETT, HE
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1964,
54
(12)
: 1428
-
&
[7]
A HIGH SPEED PRECISION AUTOMATIC ELLIPSOMETER
CAHAN, BD
论文数:
0
引用数:
0
h-index:
0
机构:
John Harrison Laboratory of Chemistry, University of Pennsylvania, Philadelphia
CAHAN, BD
SPANIER, RF
论文数:
0
引用数:
0
h-index:
0
机构:
John Harrison Laboratory of Chemistry, University of Pennsylvania, Philadelphia
SPANIER, RF
[J].
SURFACE SCIENCE,
1969,
16
: 166
-
&
[8]
INTERNAL REFLECTION ELLIPSOMETRY FOR METAL DEPOSITS
CHAN, EC
论文数:
0
引用数:
0
h-index:
0
CHAN, EC
MARTON, JP
论文数:
0
引用数:
0
h-index:
0
MARTON, JP
[J].
JOURNAL OF APPLIED PHYSICS,
1972,
43
(10)
: 4027
-
&
[9]
CONFER DE, TO BE PUBLISHED
[10]
DENENGELSEN D, 1972, J PHYS CHEM, V76, P3390
←
1
2
3
→
共 25 条
[1]
OPTICAL MEASUREMENT OF FILM GROWTH ON SILICON AND GERMANIUM SURFACES IN ROOM AIR
ARCHER, RJ
论文数:
0
引用数:
0
h-index:
0
ARCHER, RJ
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1957,
104
(10)
: 619
-
622
[2]
Aspnes D. E., 1973, Optics Communications, V8, P222, DOI 10.1016/0030-4018(73)90132-6
[3]
SPECIMEN COHERENT SCATTERING AND COMPENSATOR DEFECTS IN ELLIPSOMETRY
AZZAM, RMA
论文数:
0
引用数:
0
h-index:
0
AZZAM, RMA
BASHARA, NM
论文数:
0
引用数:
0
h-index:
0
BASHARA, NM
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1971,
61
(09)
: 1236
-
&
[4]
BASHARA NM, 1969, P S RECENT DEVELOPME
[5]
ELLIPSOMETRY IN SUB-MONOLAYER REGION
BOOTSMA, GA
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, N.V. Philips' Gloeilampenfabrieken, Eindhoven
BOOTSMA, GA
MEYER, F
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, N.V. Philips' Gloeilampenfabrieken, Eindhoven
MEYER, F
[J].
SURFACE SCIENCE,
1969,
14
(01)
: 52
-
&
[6]
EFFECT OF THIN SURFACE FILM ON ELLIPSOMETRIC DETERMINATION OF OPTICAL CONSTANTS
BURGE, DK
论文数:
0
引用数:
0
h-index:
0
BURGE, DK
BENNETT, HE
论文数:
0
引用数:
0
h-index:
0
BENNETT, HE
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1964,
54
(12)
: 1428
-
&
[7]
A HIGH SPEED PRECISION AUTOMATIC ELLIPSOMETER
CAHAN, BD
论文数:
0
引用数:
0
h-index:
0
机构:
John Harrison Laboratory of Chemistry, University of Pennsylvania, Philadelphia
CAHAN, BD
SPANIER, RF
论文数:
0
引用数:
0
h-index:
0
机构:
John Harrison Laboratory of Chemistry, University of Pennsylvania, Philadelphia
SPANIER, RF
[J].
SURFACE SCIENCE,
1969,
16
: 166
-
&
[8]
INTERNAL REFLECTION ELLIPSOMETRY FOR METAL DEPOSITS
CHAN, EC
论文数:
0
引用数:
0
h-index:
0
CHAN, EC
MARTON, JP
论文数:
0
引用数:
0
h-index:
0
MARTON, JP
[J].
JOURNAL OF APPLIED PHYSICS,
1972,
43
(10)
: 4027
-
&
[9]
CONFER DE, TO BE PUBLISHED
[10]
DENENGELSEN D, 1972, J PHYS CHEM, V76, P3390
←
1
2
3
→