EFFECT OF THIN SURFACE FILM ON ELLIPSOMETRIC DETERMINATION OF OPTICAL CONSTANTS

[1] ARCHER R, PRIVATE COMMUNICATIO

[2] DETERMINATION OF PROPERTIES OF FILMS ON SILICON BY METHOD OF ELLIPSOMETRY [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1962, 52 (09) : 970 - &

[3] OPTICAL MEASUREMENT OF FILM GROWTH ON SILICON AND GERMANIUM SURFACES IN ROOM AIR [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1957, 104 (10) : 619 - 622

[4] OPTICAL CONSTANTS OF GERMANIUM - 3600-A TO 7000-A [J]. PHYSICAL REVIEW, 1958, 110 (02): : 354 - 358

[5] BARRETT MA, PRIVATE COMMUNICATIO

[6] THIN FILMS CALCULATIONS USING THE IBM-650 ELECTRONIC CALCULATOR [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (08) : 813 - 815

[7] REFLECTANCE-INCREASING COATINGS FOR THE VACUUM ULTRAVIOLET AND THEIR APPLICATIONS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (06) : 586 - 597

[8] HEAVENS OS, 1955, OPTICAL PROPERTIES T, P125

[9] MCCRACKIN, 1963, J RES NATL BUR STD, VA 67, P363

[10] PARTINGTON JR, 1953, ADVANCED TREATISE PH, V4, P506

[1] ARCHER R, PRIVATE COMMUNICATIO

[2] DETERMINATION OF PROPERTIES OF FILMS ON SILICON BY METHOD OF ELLIPSOMETRY [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1962, 52 (09) : 970 - &

[3] OPTICAL MEASUREMENT OF FILM GROWTH ON SILICON AND GERMANIUM SURFACES IN ROOM AIR [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1957, 104 (10) : 619 - 622

[4] OPTICAL CONSTANTS OF GERMANIUM - 3600-A TO 7000-A [J]. PHYSICAL REVIEW, 1958, 110 (02): : 354 - 358

[5] BARRETT MA, PRIVATE COMMUNICATIO

[6] THIN FILMS CALCULATIONS USING THE IBM-650 ELECTRONIC CALCULATOR [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (08) : 813 - 815

[7] REFLECTANCE-INCREASING COATINGS FOR THE VACUUM ULTRAVIOLET AND THEIR APPLICATIONS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (06) : 586 - 597

[8] HEAVENS OS, 1955, OPTICAL PROPERTIES T, P125

[9] MCCRACKIN, 1963, J RES NATL BUR STD, VA 67, P363

[10] PARTINGTON JR, 1953, ADVANCED TREATISE PH, V4, P506