A HIGH SPEED PRECISION AUTOMATIC ELLIPSOMETER

被引:88
作者
CAHAN, BD
SPANIER, RF
机构
[1] John Harrison Laboratory of Chemistry, University of Pennsylvania, Philadelphia
[2] O. C. Rudolph and Sons, Inc., Caldwell
关键词
D O I
10.1016/0039-6028(69)90015-6
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
An ellipsometer is described which can measure the characteristics of a film in 0.02 sec. Fifty data points per second are generated. Azimuth can be measured with an accuracy of 0.01°. © 1969.
引用
收藏
页码:166 / &
相关论文
共 6 条
  • [1] A COMPUTER-OPERATED FOLLOWING ELLIPSOMETER
    ORD, JL
    WILLS, BL
    [J]. APPLIED OPTICS, 1967, 6 (10): : 1673 - &
  • [2] PASSAGLIA E, 1964, 256 NATL BUR STD MIS, P97
  • [3] PASSAGLIA E, 1964, 256 NATL BUR STD MIS, P115
  • [4] RAO B, 1966, THESIS U PENNSYLVANI
  • [5] TAKASAKI H, 1961, J OPT SOC AM, V51, P463, DOI 10.1364/JOSA.51.000463
  • [6] A DOUBLE-MODULATION PHOTOELECTRIC ELLIPSOMETER
    WILMANNS, I
    [J]. SURFACE SCIENCE, 1969, 16 : 147 - &