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A HIGH SPEED PRECISION AUTOMATIC ELLIPSOMETER
被引:88
作者
:
CAHAN, BD
论文数:
0
引用数:
0
h-index:
0
机构:
John Harrison Laboratory of Chemistry, University of Pennsylvania, Philadelphia
CAHAN, BD
SPANIER, RF
论文数:
0
引用数:
0
h-index:
0
机构:
John Harrison Laboratory of Chemistry, University of Pennsylvania, Philadelphia
SPANIER, RF
机构
:
[1]
John Harrison Laboratory of Chemistry, University of Pennsylvania, Philadelphia
[2]
O. C. Rudolph and Sons, Inc., Caldwell
来源
:
SURFACE SCIENCE
|
1969年
/ 16卷
关键词
:
D O I
:
10.1016/0039-6028(69)90015-6
中图分类号
:
O64 [物理化学(理论化学)、化学物理学];
学科分类号
:
070304 ;
081704 ;
摘要
:
An ellipsometer is described which can measure the characteristics of a film in 0.02 sec. Fifty data points per second are generated. Azimuth can be measured with an accuracy of 0.01°. © 1969.
引用
收藏
页码:166 / &
相关论文
共 6 条
[1]
A COMPUTER-OPERATED FOLLOWING ELLIPSOMETER
ORD, JL
论文数:
0
引用数:
0
h-index:
0
ORD, JL
WILLS, BL
论文数:
0
引用数:
0
h-index:
0
WILLS, BL
[J].
APPLIED OPTICS,
1967,
6
(10):
: 1673
-
&
[2]
PASSAGLIA E, 1964, 256 NATL BUR STD MIS, P97
[3]
PASSAGLIA E, 1964, 256 NATL BUR STD MIS, P115
[4]
RAO B, 1966, THESIS U PENNSYLVANI
[5]
TAKASAKI H, 1961, J OPT SOC AM, V51, P463, DOI 10.1364/JOSA.51.000463
[6]
A DOUBLE-MODULATION PHOTOELECTRIC ELLIPSOMETER
WILMANNS, I
论文数:
0
引用数:
0
h-index:
0
机构:
Institut d'Optique, Paris (XVe), 3, Boulevard Pasteur
WILMANNS, I
[J].
SURFACE SCIENCE,
1969,
16
: 147
-
&
←
1
→
共 6 条
[1]
A COMPUTER-OPERATED FOLLOWING ELLIPSOMETER
ORD, JL
论文数:
0
引用数:
0
h-index:
0
ORD, JL
WILLS, BL
论文数:
0
引用数:
0
h-index:
0
WILLS, BL
[J].
APPLIED OPTICS,
1967,
6
(10):
: 1673
-
&
[2]
PASSAGLIA E, 1964, 256 NATL BUR STD MIS, P97
[3]
PASSAGLIA E, 1964, 256 NATL BUR STD MIS, P115
[4]
RAO B, 1966, THESIS U PENNSYLVANI
[5]
TAKASAKI H, 1961, J OPT SOC AM, V51, P463, DOI 10.1364/JOSA.51.000463
[6]
A DOUBLE-MODULATION PHOTOELECTRIC ELLIPSOMETER
WILMANNS, I
论文数:
0
引用数:
0
h-index:
0
机构:
Institut d'Optique, Paris (XVe), 3, Boulevard Pasteur
WILMANNS, I
[J].
SURFACE SCIENCE,
1969,
16
: 147
-
&
←
1
→