SPECIMEN COHERENT SCATTERING AND COMPENSATOR DEFECTS IN ELLIPSOMETRY

被引：32

作者：

AZZAM, RMA

BASHARA, NM

机构：

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1971年 / 61卷 / 09期

关键词：

D O I：

10.1364/JOSA.61.001236

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

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页码：1236 / &

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共 8 条

[1] UNIFIED ANALYSIS OF ELLIPSOMETRY ERRORS DUE TO IMPERFECT COMPONENTS, CELL-WINDOW BIREFRINGENCE, AND INCORRECT AZIMUTH ANGLES
AZZAM, RMA
BASHARA, NM
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (05) : 600 - &
[2] GENERAL TREATMENT OF EFFECT OF CELL WINDOWS IN ELLIPSOMETRY
AZZAM, RMA
BASHARA, NM
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (06) : 773 - &
[3] SPECULAR REFLECTANCE OF ALUMINIZED GROUND GLASS AND HEIGHT DISTRIBUTION OF SURFACE IRREGULARITIES
BENNETT, HE
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1963, 53 (12) : 1389 - +
[4] MEASUREMENT OF ELASTO-OPTIC EFFECT IN ABSORBING MATERIALS BY ELLIPSOMETRY
HOLCOMB, LG
BASHARA, NM
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (05) : 608 - &
[5] EFFECTS OF POLARIZER ELLIPTICITY ON ELLIPSOMETRY MEASUREMENTS
HUNTER, WR
EATON, DH
SAH, CT
[J]. SURFACE SCIENCE, 1970, 20 (02) : 355 - &
[6] AN ELLIPSOMETRIC STUDY OF SURFACE FILMS ON COPPER ELECTRODES UNDERGOING ELECTROPOLISHING
NOVAK, M
REDDY, AKN
WROBLOWA, H
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1970, 117 (06) : 733 - &
[7] RELATION BETWEEN HEIGHT DISTRIBUTION OF A ROUGH SURFACE AND REFLECTANCE AT NORMAL INCIDENCE
PORTEUS, JO
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1963, 53 (12) : 1394 - &
[8] A THEORETICAL AND EXPERIMENTAL ANALYSIS OF ELLIPSOMETER
SMITH, PH
[J]. SURFACE SCIENCE, 1969, 16 : 34 - &