ELASTIC ELECTRON FINE-STRUCTURE - APPLICATION TO THE STUDY OF LOCAL ORDER

[1] De Crescenzi M., COMMUNICATION

[2] DECRESCENZI M, 1985, J PHYS C SOLID STATE, V18, P3595, DOI 10.1088/0022-3719/18/18/024

[3] DENBOER ML, 1978, APPL SURF SCI, V1, P278

[4] THE INFLUENCE OF ELECTRON EXCHANGE AND RELATIVISTIC CORRECTIONS ON ELASTIC LOW-ENERGY ELECTRON-DIFFRACTION FROM COMPOUND SEMICONDUCTORS [J]. SURFACE SCIENCE, 1982, 115 (01) : 195 - 218

[5] SCATTERING OF SLOW ELECTRONS BY HYDROGEN MOLECULES [J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1967, 22 (03) : 710 - &

[6] LIN BY, IN PRESS

[7] NEW TECHNIQUE FOR INVESTIGATING NONCRYSTALLINE STRUCTURES - FOURIER ANALYSIS OF EXTENDED X-RAY - ABSORPTION FINE STRUCTURE [J]. PHYSICAL REVIEW LETTERS, 1971, 27 (18) : 1204 - &

[8] SAYERS E, 1975, PHYS REV B, V11, P4836

[1] De Crescenzi M., COMMUNICATION

[2] DECRESCENZI M, 1985, J PHYS C SOLID STATE, V18, P3595, DOI 10.1088/0022-3719/18/18/024

[3] DENBOER ML, 1978, APPL SURF SCI, V1, P278

[4] THE INFLUENCE OF ELECTRON EXCHANGE AND RELATIVISTIC CORRECTIONS ON ELASTIC LOW-ENERGY ELECTRON-DIFFRACTION FROM COMPOUND SEMICONDUCTORS [J]. SURFACE SCIENCE, 1982, 115 (01) : 195 - 218

[5] SCATTERING OF SLOW ELECTRONS BY HYDROGEN MOLECULES [J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1967, 22 (03) : 710 - &

[6] LIN BY, IN PRESS

[7] NEW TECHNIQUE FOR INVESTIGATING NONCRYSTALLINE STRUCTURES - FOURIER ANALYSIS OF EXTENDED X-RAY - ABSORPTION FINE STRUCTURE [J]. PHYSICAL REVIEW LETTERS, 1971, 27 (18) : 1204 - &

[8] SAYERS E, 1975, PHYS REV B, V11, P4836