STRUCTURAL INVESTIGATION OF YBCO FILMS AND BICRYSTAL GRAIN-BOUNDARY JUNCTIONS

被引:5
作者
DELVECCHIO, A
CAMERLINGO, C
DERICCARDIS, F
HUANG, H
RUGGIERO, B
RUSSO, M
SARNELLI, E
TAGLIENTE, MA
TAPFER, L
TESTA, G
机构
[1] TSING HUA UNIV,BEIJING,PEOPLES R CHINA
[2] CNR,IST CIBERNET,I-80072 ARCO,ITALY
[3] CTR NAZL RIC & SVILUPPO MAT,BRINDISI,ITALY
[4] IST NAZL FIS NUCL,SEZ NAPOLI,NAPLES,ITALY
来源
NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA D-CONDENSED MATTER ATOMIC MOLECULAR AND CHEMICAL PHYSICS FLUIDS PLASMAS BIOPHYSICS | 1994年 / 16卷 / 12期
关键词
Conference proceedings; Superconducting films;
D O I
10.1007/BF02471862
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We present a structural analysis of YBCO superconducting thin films fabricated in situ by Inverted Cylindrical Magnetron (ICM) sputtering on commercial SrTiO3 single-crystal and bicrystal substrates. A detailed structural characterization of the superconductor films was performed by using single-crystal X-ray diffractometry confirming that YBCO films have a strong c-axis orientation of the grains with a small mosaic spread. In the films grown on bicrystal substrates we observed a strong correlation with the lattice structure of the substrate. In addition, a surface analysis of the region across the grain boundary edge has been performed by using scanning electron microscopy.
引用
收藏
页码:2025 / 2030
页数:6
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