REFRACTIVE-INDEX PROFILES OF ION-IMPLANTED FUSED-SILICA

被引：25

作者：

HEIBEI, J

VOGES, E

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1980年 / 57卷 / 02期

关键词：

D O I：

10.1002/pssa.2210570218

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：609 / 618

页数：10

共 17 条

[1]

ARITOME H, 1972, 4TH P C SOL STAT DEV

[2]

ARITOME H, 1973, J JPN SOC APPL PHY S, V42, P136

[3]

Bayly A. R., 1973, Radiation Effects, V18, P111, DOI 10.1080/00337577308234725

[4]

CHANG DC, 1975, IEEE T MICROWAVE THE, V23, P98

[5] VOLUME, INDEX-OF-REFRACTION, AND STRESS CHANGES IN ELECTRON-IRRADIATED VITREOUS SILICA [J].

DELLIN, TA ;

TICHENOR, DA ;

BARSIS, EH .

JOURNAL OF APPLIED PHYSICS, 1977, 48 (03) :1131-1138

[6] INTRODUCTION RATES AND ANNEALING OF DEFECTS IN ION-IMPLANTED SIO2 LAYERS ON SI [J].

EERNISSE, EP ;

NORRIS, CB .

JOURNAL OF APPLIED PHYSICS, 1974, 45 (12) :5196-5205

[7] COMPACTION OF ION-IMPLANTED FUSED SILICA [J].

EERNISSE, EP .

JOURNAL OF APPLIED PHYSICS, 1974, 45 (01) :167-174

[8]

GIBBONS JF, 1975, PROJECTED RANGE STAT

[9] INDEX PROFILES OF PLANAR OPTICAL-WAVEGUIDES DETERMINED FROM ANGULAR-DEPENDENCE OF REFLECTIVITY [J].

HEIBEI, J ;

VOGES, E .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 1978, 14 (07) :501-506

[10] RADIATION EFFECTS OF BOMBARDMENT OF QUARTZ AND VITREOUS SILICA BY 7.5-KEV TO 59-KEV POSITIVE IONS [J].

HINES, RL ;

ARNDT, R .

PHYSICAL REVIEW, 1960, 119 (02) :623-633

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