SYSTEMATIC REFLECTIONS IN TRANSMISSION ELECTRON DIFFRACTION

被引:20
作者
SERNEELS, R
GEVERS, R
机构
[1] Rijksuniversitair Centrum, Antwerpen
来源
PHYSICA STATUS SOLIDI | 1969年 / 33卷 / 02期
关键词
D O I
10.1002/pssb.19690330224
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The transmission and diffraction of electrons by a perfect plate‐shaped foil is considered. It is assumed that the crystal orientation with respect to the incident beam is such that there is only a single family of lattice planes, defined by the reciprocal lattice vector g, at the exact Bragg orientation, i.e. sg = 0. The active reflection g is the reflection of lowest order on the reflecting planes. Reflections on other families of lattice planes are ignored. Furthermore one considers only the case of a crystal with a center of symmetry, or that of reflecting plane in a non centro‐symmetrical crystal, which is a mirror plane or belongs to the zone of a symmetry axis of even order. The systematic reflections 2 g, – g, 3 g, – 2 g, 4 g, – 3 g, etc. on the reflecting plane are taken into account. First it is shown that the four‐beam case (0, g, 2 g, – g) can be solved analytically, giving rise to very simple formulae, which can be easily discussed. In particular one obtains a simple expression for the corrected extinction distance. Next the influence of the further beams is discussed. It is shown that the four‐beam case is a good approximation, and a quick method is described for obtaining the further corrections on the extinction distance. Copyright © 1969 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim
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页码:703 / &
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