LOW-TEMPERATURE CHARACTERISTICS OF SOLID-STATE DETECTORS FOR ENERGETIC X-RAY, ION AND ELECTRON SPECTROMETERS

被引:20
作者
VOSS, HD
REAGAN, JB
IMHOF, WL
MURRAY, DO
SIMPSON, DA
CAUFFMAN, DP
BAKKE, JC
机构
关键词
D O I
10.1109/TNS.1982.4335820
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:164 / 168
页数:5
相关论文
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