CHIP CORROSION IN PLASTIC PACKAGES

被引:16
作者
BERG, HM
PAULSON, WM
机构
来源
MICROELECTRONICS AND RELIABILITY | 1980年 / 20卷 / 03期
关键词
D O I
10.1016/0026-2714(80)90204-8
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:247 / 263
页数:17
相关论文
共 27 条
[1]  
CZANDERNA AW, 1977, ISHM P, P197
[2]  
HARPER CP, 1969, HDB ELECTRONIC PACKA, pCH7
[3]  
KOELMANS H, 1974, REL PHYS P, V12, P168
[4]  
LAWSON RW, 1974, RELIABILITY PHYSICS, V12, P243
[5]  
LAWSON RW, 1976, P S PLASTIC ENCAPSUL
[6]  
LAWSON RW, 1974, PLASTICS TELECOMMUNI
[7]  
LEE SM, 1965, RELIABILITY PHYSICS, V8, P1
[8]  
LYCOUDES N, 1978, SOLID STATE TECHNOL, V21, P53
[9]  
MICHAEL KW, 1976, ELECTRONIC COMPONENT, P382
[10]   FACTORS CONTRIBUTING TO CORROSION OF ALUMINUM METAL ON SEMICONDUCTOR-DEVICES PACKAGED IN PLASTICS [J].
OLBERG, RC ;
BOZARTH, JL .
MICROELECTRONICS AND RELIABILITY, 1976, 15 (06) :601-611