NANOSECOND TIME-SCALE SEMICONDUCTOR PHOTOEXCITATIONS PROBED BY A SCANNING TUNNELING MICROSCOPE

被引：4

作者：

GALLAGHER, MJ ^{[1
]}

RUSKELL, TG ^{[1
]}

CHEN, D ^{[1
]}

SARID, D ^{[1
]}

JENKINSON, H ^{[1
]}

机构：

[1] USA,ARDEC,PICATINNY ARSENAL,NJ 07806

来源：

APPLIED PHYSICS LETTERS | 1994年 / 64卷 / 02期

关键词：

D O I：

10.1063/1.111521

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The high-frequency response of scanning tunneling microscopy of a semiconductor is demonstrated by using the beat frequencies of the longitudinal modes of a HeNe laser at the tunneling junction. We present a comparison of the slow and fast optical response of photoexcited charge carriers in the layered structure semiconductors n-type MoS2 and p-type WSe2 using this method.

引用

收藏

页码：256 / 258

页数：3

相关论文

共 11 条

[1] PHOTOASSISTED TUNNELING SPECTROSCOPY - PRELIMINARY-RESULTS ON TUNGSTEN DISELENIDE [J].

AKARI, S ;

LUXSTEINER, MC ;

VOGT, M ;

STACHEL, M ;

DRANSFELD, K .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02) :561-563

[2] PHOTOTHERMAL MODULATION OF THE GAP DISTANCE IN SCANNING TUNNELING MICROSCOPY [J].

AMER, NM ;

SKUMANICH, A ;

RIPPLE, D .

APPLIED PHYSICS LETTERS, 1986, 49 (03) :137-139

[3] OBSERVATION OF LOCAL PHOTOEMISSION USING A SCANNING TUNNELING MICROSCOPE [J].

GIMZEWSKI, JK ;

BERNDT, R ;

SCHLITTLER, RR .

ULTRAMICROSCOPY, 1992, 42 :366-370

[4] ULTRAFAST TIME RESOLUTION IN SCANNED PROBE MICROSCOPES - SURFACE PHOTOVOLTAGE ON SI(111)-(7X7) [J].

HAMERS, RJ ;

CAHILL, DG .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02) :514-518

[5] SURFACE PHOTOVOLTAGE ON SI(111)-(7X7) PROBED BY OPTICALLY PUMPED SCANNING TUNNELING MICROSCOPY [J].

HAMERS, RJ ;

MARKERT, K .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04) :3524-3530

[6]

MOLLER R, 1992, AIP CONF PROC, V241, P314

[7]

SAKATA T, 1986, J ELECTROCHEM SOC, V133, P340

[8] SCANNING TUNNELING MICROSCOPY ON PHOTOCONDUCTIVE SEMIINSULATING GAAS [J].

VANDEWALLE, GFA ;

VANKEMPEN, H ;

WYDER, P ;

DAVIDSSON, P .

APPLIED PHYSICS LETTERS, 1987, 50 (01) :22-24

[9] LASER-ASSISTED SCANNING TUNNELING MICROSCOPY [J].

VOLCKER, M ;

KRIEGER, W ;

SUZUKI, T ;

WALTHER, H .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02) :541-544

[10] OPTICAL-ABSORPTION MICROSCOPY AND SPECTROSCOPY WITH NANOMETER RESOLUTION [J].

WEAVER, JMR ;

WALPITA, LM ;

WICKRAMASINGHE, HK .

NATURE, 1989, 342 (6251) :783-785