DETERMINATION OF THE VALENCE CHARGE-DENSITY OF ELEMENTAL SEMICONDUCTORS AND COMPOUNDS-III-V WITH X-RAY-DIFFRACTION METHODS

被引：1

作者：

BRUHL, HG

机构：

来源：

PHYSICA STATUS SOLIDI B-BASIC RESEARCH | 1981年 / 107卷 / 01期

关键词：

D O I：

10.1002/pssb.2221070130

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：289 / 295

页数：7

共 38 条

[1] [Anonymous], 1966, XRAY DETERMINATION E
[2] [Anonymous], 1974, INT TABLES XRAY CRYS, VIV
[3] COVALENT CHARGE TRANSFER IN 3-V COMPOUNDS
ATTARD, AE
MIFSUD, FA
SANT, AK
SULTANA, JA
[J]. JOURNAL OF PHYSICS PART C SOLID STATE PHYSICS, 1969, 2 (05): : 816 - +
[4] X-RAY DETERMINATION OF VALENCE-ELECTRON CHARGE-DENSITY AND ITS TEMPERATURE-DEPENDENCE IN INDIUM-ANTIMONIDE
BILDERBACK, DH
COLELLA, R
[J]. PHYSICAL REVIEW B, 1976, 13 (06): : 2479 - 2488
[5] VALENCE CHARGE-DENSITY IN GREY TIN - X-RAY DETERMINATION OF (222) FORBIDDEN REFLECTION AND ITS TEMPERATURE-DEPENDENCE
BILDERBACK, DH
COLELLA, R
[J]. PHYSICAL REVIEW B, 1975, 11 (02): : 793 - 797
[6] BILDERBACK DH, 1975, THESIS PURDUE U W LA
[7] Brill R, 1939, ANN PHYS-BERLIN, V34, P393
[8] BRUHL HG, UNPUBLISHED
[9] ELECTRONIC CHARGE-DENSITIES AND TEMPERATURE-DEPENDENCE OF FORBIDDEN (222) REFLECTION IN SILICON AND GERMANIUM
CHELIKOWSKY, JR
COHEN, ML
[J]. PHYSICAL REVIEW LETTERS, 1974, 33 (22) : 1339 - 1342
[10] VALENCE-CHARGE DENSITY OF GRAPHITE
CHEN, R
TRUCANO, P
STEWART, RF
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1977, 33 (SEP1): : 823 - 828