REFINEMENT ON THE THEORIES OF MEASUREMENT FOR TRAP DENSITY FROM SPACE-CHARGE-LIMITED CURRENT

被引：3

作者：

LU, LG

机构：

[1] Asia Simulation and Control System Engineering Corporation Ltd.

来源：

JOURNAL OF APPLIED PHYSICS | 1993年 / 73卷 / 01期

关键词：

D O I：

10.1063/1.353898

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The theory of space-charge-limited current (SCLC) measurement for determining an arbitrary energy distribution of traps of insulators and semiconductors is put forward in this article. As a result, no restriction is given to the trap densities of the sample tested, which is caused by neglecting free carriers in the previous theories of SCLC measurement. It is shown by numerical computations that the relative errors near the band edges that usually differ by as much as several orders of magnitude is greatly improved. The refinement is also expected to be useful in the high-temperature region.

引用

页码：261 / 264

页数：4

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