ITERATIVE DECONVOLUTION OF SMEARED DATA FUNCTIONS

[1] True and apparent intensity distribution in spectral lines. [J]. ZEITSCHRIFT FUR PHYSIK, 1932, 79 (11-12): : 722 - 730

[2] DIRECT METHOD FOR UNFOLDING CONVOLUTION PRODUCTS - ITS APPLICATION TO X-RAY SCATTERING INTENSITIES [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1968, 1 : 19 - &

[3] Gupta P. K., 1970, Journal of Physics D (Applied Physics), V3, P1919, DOI 10.1088/0022-3727/3/12/320

[4] Lanczos, 1966, DISCOURSE FOURIER SE

[5] A DIRECT METHOD OF CORRECTION OF X-RAY DIFFRACTION LINE PROFILES .1. NUMERIC DECONVOLUTION METHOD [J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1969, A 25 : 335 - &

[6] A DIRECT METHOD OF CORRECTION OF X-RAY DIFFRACTION LINE PROFILES .2. EFFECT OF RECEPTOR SLIT ON REGISTRATION OF AN X-RAY DIFFRACTION LINE PROFILE [J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1969, A 25 : 338 - &

[7] MOORE L, 1968, BRIT J APPL PHYS, V1, P237

[8] RAPPERPORT EJ, 1969, ELECTRON PROBE MICRO

[9] SMOOTHING + DIFFERENTIATION OF DATA BY SIMPLIFIED LEAST SQUARES PROCEDURES [J]. ANALYTICAL CHEMISTRY, 1964, 36 (08) : 1627 - &

[10] SMOOTHING AND DIFFERENTIATION OF DATA BY SIMPLIFIED LEAST SQUARE PROCEDURE [J]. ANALYTICAL CHEMISTRY, 1972, 44 (11) : 1906 - &

[1] True and apparent intensity distribution in spectral lines. [J]. ZEITSCHRIFT FUR PHYSIK, 1932, 79 (11-12): : 722 - 730

[2] DIRECT METHOD FOR UNFOLDING CONVOLUTION PRODUCTS - ITS APPLICATION TO X-RAY SCATTERING INTENSITIES [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1968, 1 : 19 - &

[3] Gupta P. K., 1970, Journal of Physics D (Applied Physics), V3, P1919, DOI 10.1088/0022-3727/3/12/320

[4] Lanczos, 1966, DISCOURSE FOURIER SE

[5] A DIRECT METHOD OF CORRECTION OF X-RAY DIFFRACTION LINE PROFILES .1. NUMERIC DECONVOLUTION METHOD [J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1969, A 25 : 335 - &

[6] A DIRECT METHOD OF CORRECTION OF X-RAY DIFFRACTION LINE PROFILES .2. EFFECT OF RECEPTOR SLIT ON REGISTRATION OF AN X-RAY DIFFRACTION LINE PROFILE [J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1969, A 25 : 338 - &

[7] MOORE L, 1968, BRIT J APPL PHYS, V1, P237

[8] RAPPERPORT EJ, 1969, ELECTRON PROBE MICRO

[9] SMOOTHING + DIFFERENTIATION OF DATA BY SIMPLIFIED LEAST SQUARES PROCEDURES [J]. ANALYTICAL CHEMISTRY, 1964, 36 (08) : 1627 - &

[10] SMOOTHING AND DIFFERENTIATION OF DATA BY SIMPLIFIED LEAST SQUARE PROCEDURE [J]. ANALYTICAL CHEMISTRY, 1972, 44 (11) : 1906 - &