THEORY OF CONTINUOUSLY DISTRIBUTED TRAP STATES AT SI-SIO2 INTERFACES

被引：194

作者：

SAKURAI, T

SUGANO, T

机构：

来源：

关键词：

D O I：

10.1063/1.329023

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2889 / 2896

页数：8

共 21 条

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