MAXIMAL FRACTION OF ACCEPTABLE MEASUREMENTS IN PHASE-SHIFTING SPECKLE INTERFEROMETRY - A THEORETICAL-STUDY

被引:20
作者
SLETTEMOEN, GA
WYANT, JC
机构
[1] NORWEGIAN INST TECHNOL,SINTEF,N-7034 TRONDHEIM,NORWAY
[2] UNIV ARIZONA,CTR OPT SCI,TUCSON,AZ 85721
来源
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1986年 / 3卷 / 02期
关键词
D O I
10.1364/JOSAA.3.000210
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:210 / 214
页数:5
相关论文
共 10 条
[1]  
Abbiss J. B., 1974, Optics and Laser Technology, V6, P249, DOI 10.1016/0030-3992(74)90006-1
[2]  
[Anonymous], 1983, HOLOGRAPHIC SPECKLE
[3]  
Bruning J.H., 1978, OPTICAL SHOP TESTING
[4]  
CarreP, 1966, METROLOGIA, V2, P13, DOI DOI 10.1088/0026-1394/2/1/005
[5]  
Davenport WB, 1958, INTRO THEORY RANDOM
[6]  
Goodman J. W., 1963, STAT PROPERTIES LASE
[7]  
KOLIOPOULOS C, 1981, THESIS U ARIZONA TUC
[9]   USE OF AN AC HETERODYNE LATERAL SHEAR INTERFEROMETER WITH REAL-TIME WAVEFRONT CORRECTION SYSTEMS [J].
WYANT, JC .
APPLIED OPTICS, 1975, 14 (11) :2622-2626
[10]   TESTING ASPHERICS USING 2-WAVELENGTH HOLOGRAPHY - USE OF DIGITAL ELECTRONIC TECHNIQUES [J].
WYANT, JC ;
OREB, BF ;
HARIHARAN, P .
APPLIED OPTICS, 1984, 23 (22) :4020-4023