ION-BEAM CRYSTALLOGRAPHY OF SILICON SURFACES .1. SI(100)-(1X1)2H

被引：33

作者：

TROMP, RM

SMEENK, RG

SARIS, FW

机构：

来源：

SURFACE SCIENCE | 1981年 / 104卷 / 01期

关键词：

D O I：

10.1016/0039-6028(81)90120-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：13 / 25

页数：13

共 31 条

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[8]

DEMOND FJ, 1980, NUCL INSTRUM METHODS, V168, P69, DOI 10.1016/0029-554X(80)91233-1

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