EXCHANGE BIAS ENHANCEMENT THROUGH INTERDIFFUSION OF NIFE/FEMN/METAL FILMS

被引:8
作者
CHEN, MM [1 ]
TSANG, C [1 ]
GHARSALLAH, N [1 ]
机构
[1] IBM CORP,ALMADEN RES CTR,DIV RES,SAN JOSE,CA 95120
关键词
D O I
10.1109/20.281395
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The exchange bias field of the NiFe/TeMn system was found to increase from 30-35 Oe up to 75 Oe by annealing a three layer film structure of NiFe(300 Angstrom)/FeMn/M (M = Au, Rh, Pt, Cr, Cu etc.) at elevated temperature. Anger electron spectroscopy Showed that interdiffusion occurred in the multilayer structure between the FeMn and the metal layer. The increase in exchange bias field is attributed to the altered interface of NiFe/FeMn due to the interdiffusion,
引用
收藏
页码:4077 / 4079
页数:3
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