DIRECT MEASUREMENT OF CRYSTALLOGRAPHIC PHASE BY ELECTRON-DIFFRACTION

被引：21

作者：

BIRD, DM ^{[1
]}

JAMES, R ^{[1
]}

PRESTON, AR ^{[1
]}

机构：

[1] UNIV BRISTOL,HH WILLS PHYS LAB,BRISTOL BS8 1TL,AVON,ENGLAND

来源：

PHYSICAL REVIEW LETTERS | 1987年 / 59卷 / 11期

关键词：

D O I：

10.1103/PhysRevLett.59.1216

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1216 / 1219

页数：4

共 13 条

[1] BIRD DM, IN PRESS
[2] RELATIVISTIC HARTREE-FOCK X-RAY AND ELECTRON SCATTERING FACTORS
DOYLE, PA
TURNER, PS
[J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 : 390 - &
[3] DIRECT DETERMINATION OF X-RAY REFLECTION PHASE RELATIONSHIPS THROUGH SIMULTANEOUS REFLECTION
HART, M
LANG, AR
[J]. PHYSICAL REVIEW LETTERS, 1961, 7 (04) : 120 - &
[4] DIFFRACTION CONTRAST OF ELECTRON MICROSCOPE IMAGES OF CRYSTAL LATTICE DEFECTS .2. DEVELOPMENT OF A DYNAMICAL THEORY
HOWIE, A
WHELAN, MJ
[J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1961, 263 (1312) : 217 - +
[5] SCATTERING OF FAST ELECTRONS BY CRYSTALS
HUMPHREYS, CJ
[J]. REPORTS ON PROGRESS IN PHYSICS, 1979, 42 (11) : 1825 - &
[6] QUANTITATIVE-ANALYSIS OF CBED TO DETERMINE POLARITY AND IONICITY OF ZNS-TYPE CRYSTALS
ISHIZUKA, K
TAFTO, J
[J]. ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1984, 40 (AUG): : 332 - 337
[7] INVARIANT-PHASE INFORMATION OF X-RAY STRUCTURE FACTORS IN THE 2-BEAM BRAGG INTENSITY NEAR A 3-BEAM POINT
JURETSCHKE, HJ
[J]. PHYSICAL REVIEW LETTERS, 1982, 48 (21) : 1487 - 1489
[8] STUDY OF SIMULTANEOUS REFLEXION IN ELECTRON DIFFRACTION BY CRYSTALS .1. THEORETICAL TREATMENT
KAMBE, K
[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1957, 12 (01) : 13 - 25
[9] RELATIVE PHASES OF DIFFRACTION MAXIMA BY MULTIPLE REFLECTION
LIPSCOMB, WN
[J]. ACTA CRYSTALLOGRAPHICA, 1949, 2 (03): : 193 - 194
[10] THE PHASES OF FORBIDDEN REFLECTIONS
POST, B
LADELL, J
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1987, 43 : 173 - 179

← 1 2 →