QUANTITATIVE-ANALYSIS OF CBED TO DETERMINE POLARITY AND IONICITY OF ZNS-TYPE CRYSTALS

被引：27

作者：

ISHIZUKA, K

TAFTO, J

机构：

[1] ARIZONA STATE UNIV,CTR SOLID STATE SCI,TEMPE,AZ 85287

[2] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287

来源：

ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE | 1984年 / 40卷 / AUG期

关键词：

D O I：

10.1107/S010876818400224X

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：332 / 337

页数：6

共 14 条

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[2] [Anonymous], 1974, INT TABLES XRAY CRYS, VIV
[3] THE SCATTERING OF ELECTRONS BY ATOMS AND CRYSTALS .1. A NEW THEORETICAL APPROACH
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[4] APPLICATION OF NON-SYSTEMATIC MANY-BEAM DYNAMIC EFFECTS TO STRUCTURE-FACTOR DETERMINATION
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[J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1971, A 27 (JUL1) : 313 - &
[5] OBSERVATION OF BREAKDOWN OF FRIEDELS LAW IN ELECTRON DIFFRACTION AND SYMMETRY DETERMINATION FROM ZERO-LAYER INTERACTIONS
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[J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 : 339 - +
[6] MULTISLICE FORMULA FOR INCLINED ILLUMINATION
ISHIZUKA, K
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1982, 38 (NOV): : 773 - 779
[7] STUDY OF SIMULTANEOUS REFLEXION IN ELECTRON DIFFRACTION BY CRYSTALS .1. THEORETICAL TREATMENT
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[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1957, 12 (01) : 13 - 25
[8] DETERMINATION OF FOIL THICKNESS BY SCANNING-TRANSMISSION ELECTRON-MICROSCOPY
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JOSTSONS, A
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NAPIER, JG
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 31 (02): : 771 - 780
[9] LILIENTAL Z, 1982, 40TH ANN P EL MICR S, P448
[10] MCCOWLEY J, 1981, DIFFRACTION PHYSICS

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