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SCANNING TUNNELING MICROSCOPE COMPUTER AUTOMATION
被引:6
作者
:
BECKER, J
论文数:
0
引用数:
0
h-index:
0
BECKER, J
机构
:
来源
:
SURFACE SCIENCE
|
1987年
/ 181卷
/ 1-2期
关键词
:
D O I
:
10.1016/0039-6028(87)90159-2
中图分类号
:
O64 [物理化学(理论化学)、化学物理学];
学科分类号
:
070304 ;
081704 ;
摘要
:
引用
收藏
页码:200 / 209
页数:10
相关论文
共 17 条
[1]
BAPST UH, 1985, RZ139851013 IBM ZUR
[2]
BINNIG G, 1982, HELV PHYS ACTA, V55, P726
[3]
SCANNING TUNNELING MICROSCOPY
BINNIG, G
论文数:
0
引用数:
0
h-index:
0
BINNIG, G
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
[J].
SURFACE SCIENCE,
1983,
126
(1-3)
: 236
-
244
[4]
SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY
BINNING, G
论文数:
0
引用数:
0
h-index:
0
BINNING, G
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
GERBER, C
论文数:
0
引用数:
0
h-index:
0
GERBER, C
WEIBEL, E
论文数:
0
引用数:
0
h-index:
0
WEIBEL, E
[J].
PHYSICAL REVIEW LETTERS,
1982,
49
(01)
: 57
-
61
[5]
DEMUTH JE, IN PRESS IBM J RES D
[6]
SURFACE ELECTRONIC-STRUCTURE OF SI(111)-(7 X 7) RESOLVED IN REAL SPACE
HAMERS, RJ
论文数:
0
引用数:
0
h-index:
0
HAMERS, RJ
TROMP, RM
论文数:
0
引用数:
0
h-index:
0
TROMP, RM
DEMUTH, JE
论文数:
0
引用数:
0
h-index:
0
DEMUTH, JE
[J].
PHYSICAL REVIEW LETTERS,
1986,
56
(18)
: 1972
-
1975
[7]
CHARACTERIZATION OF ELECTRON TRAPPING DEFECTS ON SILICON BY SCANNING TUNNELING MICROSCOPY
KOCH, RH
论文数:
0
引用数:
0
h-index:
0
KOCH, RH
HAMERS, RJ
论文数:
0
引用数:
0
h-index:
0
HAMERS, RJ
[J].
SURFACE SCIENCE,
1987,
181
(1-2)
: 333
-
339
[8]
NAEGELE T, 1985, ELECTRONICS 0617, P61
[9]
Palmer J.F., 1984, 8087 PRIMER
[10]
COMPUTER AUTOMATION FOR SCANNING TUNNELING MICROSCOPY
SCHROER, PH
论文数:
0
引用数:
0
h-index:
0
SCHROER, PH
BECKER, J
论文数:
0
引用数:
0
h-index:
0
BECKER, J
[J].
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1986,
30
(05)
: 543
-
552
←
1
2
→
共 17 条
[1]
BAPST UH, 1985, RZ139851013 IBM ZUR
[2]
BINNIG G, 1982, HELV PHYS ACTA, V55, P726
[3]
SCANNING TUNNELING MICROSCOPY
BINNIG, G
论文数:
0
引用数:
0
h-index:
0
BINNIG, G
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
[J].
SURFACE SCIENCE,
1983,
126
(1-3)
: 236
-
244
[4]
SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY
BINNING, G
论文数:
0
引用数:
0
h-index:
0
BINNING, G
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
GERBER, C
论文数:
0
引用数:
0
h-index:
0
GERBER, C
WEIBEL, E
论文数:
0
引用数:
0
h-index:
0
WEIBEL, E
[J].
PHYSICAL REVIEW LETTERS,
1982,
49
(01)
: 57
-
61
[5]
DEMUTH JE, IN PRESS IBM J RES D
[6]
SURFACE ELECTRONIC-STRUCTURE OF SI(111)-(7 X 7) RESOLVED IN REAL SPACE
HAMERS, RJ
论文数:
0
引用数:
0
h-index:
0
HAMERS, RJ
TROMP, RM
论文数:
0
引用数:
0
h-index:
0
TROMP, RM
DEMUTH, JE
论文数:
0
引用数:
0
h-index:
0
DEMUTH, JE
[J].
PHYSICAL REVIEW LETTERS,
1986,
56
(18)
: 1972
-
1975
[7]
CHARACTERIZATION OF ELECTRON TRAPPING DEFECTS ON SILICON BY SCANNING TUNNELING MICROSCOPY
KOCH, RH
论文数:
0
引用数:
0
h-index:
0
KOCH, RH
HAMERS, RJ
论文数:
0
引用数:
0
h-index:
0
HAMERS, RJ
[J].
SURFACE SCIENCE,
1987,
181
(1-2)
: 333
-
339
[8]
NAEGELE T, 1985, ELECTRONICS 0617, P61
[9]
Palmer J.F., 1984, 8087 PRIMER
[10]
COMPUTER AUTOMATION FOR SCANNING TUNNELING MICROSCOPY
SCHROER, PH
论文数:
0
引用数:
0
h-index:
0
SCHROER, PH
BECKER, J
论文数:
0
引用数:
0
h-index:
0
BECKER, J
[J].
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1986,
30
(05)
: 543
-
552
←
1
2
→